Optical and electrical characteristics of ZnO/Si heterojunction

dc.contributor.authorMurape, Davison Munyaradzi
dc.date.accessioned2016-03-10T07:30:20Z
dc.date.accessioned2023-06-26T13:01:47Z
dc.date.available2016-03-10T07:30:20Z
dc.date.available2023-06-26T13:01:47Z
dc.date.issued2014-03
dc.descriptionPublished Journal Articleen_US
dc.description.abstractSelf-assembled ZnO nanorods have been synthesized on a seeded Si substrate by a simple chemical bath deposition method at a temperature of 80 1C. Room-temperature photoluminescence analysis revealed material of high optical quality with a low density of defects that can be reduced by post growth annealing. Current–voltage measurements on these devices showed excellent rectification. Junction characteristics were also studied using capacitance–voltage measurements and showed that the junction characteristics are mainly determined by the properties of the p-Si substrate. Based on the energy band diagram and possible interface states at the junction, it was suggested that the current transport in the device is predominantly determined by hopping of charge carriers between localized states through a multi-step tunneling process.en_US
dc.identifier.citationMurape, D. 2014. Optical and electrical characteristics of ZnO/Si heterojunction. Elsevier, Port Elizabeth.en_US
dc.identifier.urihttp://ir.nust.ac.zw:4000/handle/123456789/621
dc.publisherElsevieren_US
dc.subjectZnOen_US
dc.subjectNanoroidsen_US
dc.subjectSien_US
dc.subjectPhotoluminescenceen_US
dc.subjectCurrent-voltageen_US
dc.titleOptical and electrical characteristics of ZnO/Si heterojunctionen_US
dc.typeArticleen_US

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