Transport characteristics of Pd Schottky barrier diodes on epitaxial n-GaSb as determined from temperature dependent current–voltage measurements

dc.contributor.authorMurape, Davison Munyaradzi
dc.date.accessioned2016-03-10T07:47:59Z
dc.date.accessioned2023-06-26T13:01:48Z
dc.date.available2016-03-10T07:47:59Z
dc.date.available2023-06-26T13:01:48Z
dc.date.issued2014-11
dc.descriptionPublished Journal Articleen_US
dc.description.abstractThe temperature dependent transport characteristics of Pd/n-GaSb:Te Schottky contacts with lowand saturating reverse current are investigated bymeans of current–voltage measurements between 80 K and 320 K. The apparent barrier height and ideality factor increase with a decrease in temperature. Neither thermionic nor thermionic field emission can explain the low temperature characteristics of these diodes. Instead, evidence is presented for barrier inhomogeneity across the metal/semiconductor contact. A plot of the barrier height, ϕb vs. 1/2kT revealed a double Gaussian distribution for the barrier height with ϕb,mean assuming values of 0.59 eV± 0.07 (80–140 K) and 0.25 eV ± 0.12 (140–320 K) respectively.en_US
dc.identifier.citationMurape, D. 2014. Transport characteristics of Pd Schottky barrier diodes on epitaxial n-GaSb as determined from temperature dependent current–voltage measurements. Elsevier, Port Elizabeth.en_US
dc.identifier.urihttp://ir.nust.ac.zw:4000/handle/123456789/623
dc.publisherElsevieren_US
dc.subjectCurrent-voltage measurementsen_US
dc.subjectTransport characteristicsen_US
dc.subjectBarrier heighten_US
dc.subjectGaussian distributionen_US
dc.titleTransport characteristics of Pd Schottky barrier diodes on epitaxial n-GaSb as determined from temperature dependent current–voltage measurementsen_US
dc.typeArticleen_US

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